Details

Title

A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain

Journal title

Metrology and Measurement Systems

Yearbook

2010

Numer

No 1

Authors

Keywords

RTS noise ; Gram-Charlier series ; semiconductor devices ; optocouplers

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2010

Type

Artykuły / Articles

Identifier

ISSN 0860-8229

Pages

95-107

References

Dawson J. (1996), Electrochemical Noise Measurement for Corrosion Application. ; Pujar M. (2007), Analysis of Electrochemical Noise (EN) Data Using MEM for Pitting Corrosion of 316 SS in Chloride Solution, Int. J. Electrochem. Sci, 2, 301. ; Kish L. (2003), Noise and Information in nanoelectronics, sensors and Standards. In, null, 5115. ; Kotarski M. (2009), Noise measurement set-ups for fluctuations-enhanced gas sensing, Metrol. Meas. Syst, 16, 3, 457. ; Claeys C. (1998), Noise as a diagnostic tool for semiconductor material and device characterization, J. Electrochem. Soc, 145, 6, 2058. ; Ciofi C. (2000), Low-frequency noise measurements as a characterisation tool for degradation phenomena in solid-state devices, J. Phys. D. Appl, 33, 199. ; Jones B. (2002), Electrical noise as a reliability indicator in electronic devices and components, IEEE Proc.-Circuits Devices Syst, 149, 1, 13. ; Konczakowska A. (1995), Quality and 1/f noise of electronic components, Quality and Reliability Engineering International, 11, 165. ; Konczakowska A. (2006), Identification of optocoupler devices with RTS noise, Fluctuation and Noise Letters, 6, 4. ; Lal-Jadziak J. (2009), Variance of random signal mean square value digital estimator, Metrol. Meas. Syst, 16, 2, 267. ; Konczakowska A. (2007), Low frequency noise, measurements methods, application to quality of semiconductor devices evaluation. ; Celik-Butler Z. (2004), Measurement and analysis methods for Random Telegraph Signals, null, 151. ; Vandamme L. (2005), 1/f and RTS noise in submicron devices: Faster is noisier, Unsolved problems of nosie and fluctuations: UPoN 2005: Fourth International Conference on Unsolved Problems of Noise and Fluctuations in Physics, Biology, and High Technology. AIP Conference Proceedings, 800, 436. ; Yuzhelevki Y. (2000), Random Telegraph Noise analysis in time domain, Rev. Scientific Instruments, 71. ; Cichosz J. (2005), Noise scattering patterns methods for recognition of RTS noise in semiconductor components, null, 673. ; Stawarz-Graczyk B. (2007), The automatic system for identification of random telegraph signal (RTS) noise in noise signals, Metrol. Meas. Syst, 14, 2, 219. ; Stawarz-Graczyk B. (2009), The identification of inherent noise components of semiconductor devices on an example of optocouplers, Opto-Electronics Review, 17, 2, 87. ; Drapella A. (2004), Statistical inference on the basis of skewness and kurtosis. ; Blinnikov S. (1998), Expansions for nearly Gaussian distributions, Astron. Astrophys. Suppl. Ser, 130, 193. ; Hald A. (2000), The Early History of the Cumulants and the Gram-Charlier Series, International Statistical Review, 68, 2, 137. ; Lal-Jadziak J. (2008), Models of bias of mean square value digital estimator for selected deterministic and random signals, Metrol. Meas. Syst, 15, 1, 55.

DOI

10.2478/v10178-010-0010-z

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