Details

Title

Measurement and Analysis of Thermal Parameters and Efficiency of Laser Heterostructures and Light-Emitting Diodes

Journal title

Metrology and Measurement Systems

Yearbook

2010

Numer

No 1

Authors

Keywords

heterostructure ; light-emitting diode ; thermal resistance ; efficiency

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2010

Type

Artykuły / Articles

Identifier

ISSN 0860-8229

Pages

39-45

References

Gribkovskii V. (1995), Injection lasers, Prog. Quantum Electron, 19, 1, 41. ; Coldren L. (1995), Diode Lasers and Photonic Integrated Circuits. ; Mrozievich B. (1991), Physics of Semiconductor Lasers. ; Fitzpatrick J. (1995), Laser diode arrays: pump up the power, Photonics Spectra, 29, 11, 105. ; Steele R. (2006), Diode doldrums, Laser Focus World, 42, 2, 69. ; Joullié A. (2003), GaSb-based mid-infrared 2-5 μm laser diodes, C. R. Physique, 4, 6, 621. ; Vicet A. (2002), Trace gas detection with antimonide-based quantum-well diode lasers, Spectrochimica Acta. Part A, 58, 11, 2405. ; Glukhikh I. (2003), 0.81 μm CW laser bars with hyperthin InGaAs active layers, null, 61. ; Bulashevich K. (2007), Effect of free-carrier absorption on performance of 808 nm AlGaAs-based high-power laser diodes, Semicond. Sci. Technol, 22, 5, 502. ; Hughes J. (1985), Measurement of the thermal resistance of packaged laser diodes, RCA Rev, 46, 2, 200. ; Ryabtsev G. (1995), Thermal properties of high-power InGaAs/AlGaAs laser diodes, J. Appl. Spectrosc, 62, 5, 900. ; Bumai, Y. A., Vaskou, A. S., Domanevskii, D. S. (2007). Thermal processes in high-intensity InGaN/GaN light-emitting diodes. <i>Book of papers, 6<sup>th</sup> Belarussian-Russian Workshop. Semiconductor Lasers and Systems</i>. Minsk, 108-112. ; Hulett J. (2008), Measuring LED junction temperature, Photonics Spectra, 42, 7, 73. ; Sofia J. (1995), Analysis of thermal transient data with synthesized dynamic models for semiconductor devices, IEEE Trans. Components, Packaging, and Manufacturing Technol. Part A, 18, 1, 39. ; Székely V. (1998), THERMODEL: a tool for compact dynamic thermal model generation, Microelectron. J, 29, 4-5, 257. ; Gerstenmaier Y. (2002), Rigorous model and network for transient thermal problems, Microelectron. J, 33, 9, 719. ; Farkas G. (2005), Thermal investigation of high power optical devices by transient testing, IEEE Trans. Components and Packaging Technol, 28, 1, 45.

DOI

10.2478/v10178-010-0004-x

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