Details
Title
Assessment of Free-Form Surfaces’ Reconstruction AccuracyJournal title
Metrology and Measurement SystemsYearbook
2017Volume
vol. 24Numer
No 2Authors
Keywords
reverse engineering ; accuracy assessment ; free-form surface ; coordinate measuring machine ; radius correctionDivisions of PAS
Nauki TechniczneCoverage
303–312Publisher
Polish Academy of Sciences Committee on Metrology and Scientific InstrumentationDate
2017.06.30Type
Artykuły / ArticlesIdentifier
ISSN 0860-8229References
Xiong (2003), Probe radius compensation of workpiece localization, Manuf Sci Eng, 125. ; Zhongwei (2003), Methodology of NURBS surface fitting based on off - line software compensation of errors of a CMM, Precis Eng, 27, 299. ; Woźniak (2009), Stylus tip envelop method : corrected measured point determination in high definition coordinate metrology, Int J Adv Manuf Technol, 42. ; Lee (2010), Calculation of the unit normal vector using the cross - curve moving mask method for probe radius compensation of a freeform surface measurement, Measurement, 43. ; Poniatowska (2008), Determining uncertainty of fitting discrete measurement data to a nominal surface, Metrol Meas Syst, 15, 595. ; Li (2004), Free - form surface inspection techniques state of the art review, Comput Aided Des, 36. ; Woźniak (2012), Robust method for probe tip radius correction in coordinate metrology, Meas Sci Technol, 23. ; Poniatowska (2012), Deviation model based method of planning accuracy inspection of free - form surfaces using CMMs, Measurement, 45. ; Park (2006), Development of a coordinate measuring machine touch probe using a multi - axis force sensor, CMM Meas Sci Technol, 17, 2380. ; Poniatowska (2015), Free - form surface machining error compensation applying CAD machining pattern model, Comput Aided Des, 62, 227. ; Werner (1998), Reverse engineering of free - form surfaces Process, Mater Technol, 76. ; Lin (2003), Probe radius compensated by the multicross product method in freeform surface measurement with touch trigger probe CMM, Int J Adv Manuf Technol, 21, 902.DOI
10.1515/mms-2017-0035