This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.
This paper presents an improved approach for locating and identifying faults for UHV overhead Transmission line by using GA-ANFIS. The proposed method uses one end data to identify the fault location. The ANFIS can be viewed either as a Fuzzy system, neural network or fuzzy neural network FNN. The integration with neural technology enhances fuzzy logic system on learning capabilities are proposed to analyze the UHV system under different fault conditions. The performance variation of two controllers in finding fault location is analyzed. This paper analyses various faults under different conditions in an UHV using Matlab/simulink. The proposed method is evaluated under different fault conditions such as fault inception angle, fault resistance and fault distance. Simulation results confirm that the proposed method can be used as an efficient for accurate fault location on the transmission line.