A thermal resistance characterization of semiconductor quantum-well heterolasers in the AlGaInAs-AlGaAs system (λst ≈ 0.8 μm), GaSb-based laser diodes (λst ≈ 2 μm), and power GaN light-emitting diodes (visible spectral region) was performed. The characterization consists in investigations of transient electrical processes in the diode sources under heating by direct current. The time dependence of the heating temperature of the active region of a source ΔT(t), calculated from direct bias change, is analyzed using a thermal RTCT equivalent circuit (the Foster and Cauer models), where RT is the thermal resistance and CT is the heat capacity of the source elements and external heat sink. By the developed method, thermal resistances of internal elements of the heterolasers and light-emitting diodes are determined. The dominant contribution of a die attach layer to the internal thermal resistance of both heterolaser sources and light-emitting diodes is observed. Based on the performed thermal characterization, the dependence of the optical power efficiency on current for the laser diodes is determined.
In this work studies ofM OVPE growth of InAlGaAs/AlGaAs/GaAs heterostructures are presented. The HRXRD and SIMS measurements indicate the high structural and optical properties as well as high uniformity oft hickness and composition ofI nAlGaAs quantum wells. This work is the .rst step towards elaboration oft he technology oft he strained InAlGaAs/GaAs heterostructures for advanced optoelectronic devices working in the visible part oft he spectrum. The investigations ofSi (n-type), Zn (p-type) .-doped GaAs epilayers and centre Si-.-doped InxGa1-xAs single quantum well (SQW) are presented. The .-doping layer was formed by SiH4 or DEZn introduction during the growth interruption. The electrical and optical properties oft he obtained structures were examined using C-V measurement, EC-V electrochemical pro.ler, Raman spectroscopy (RS), photore.ectance (PR) and photocurrent (PC) spectroscopies. Technology oft hick GaN layers grown on sapphire by HVPE is very promising as a part off reestanding GaN substrates manufacturing. Further works will be focused on the optimisation of growth, separating layers from substrates and surface polishing. The in.uence oft he growth parameters on the properties of( Ga, Al)N/Al2O3 and Mg dopant incorporation was studied.
The double barrier separate confinement heterostructure (DBSCH) design aimed at reduction of vertical beam divergence and increase of catastrophic optical damage (COD) level for high power laser diodes (LDs) operation is presented. Insertion of thin, wide-gap barrier layers at the interfaces between waveguide and cladding layers of SCH gives an additional degree of freedom in design making possible more precise shaping of the optical field distribution in the laser cavity. By comparison with the large optical cavity (LOC) heterostructure design it has been shown that the low beam divergence emission of DBSCH LDs can be attributed to the soft-profiled field distribution inside the cavity. This soft mode profile seems to determine narrow laser beam emission rather than the field distribution width itself. The potential problem with the soft-profiled but relatively narrow (at half-maximum) mode distribution is a lower COD level. Widening of the mode profile by the heterostructure design corrections can increase it, but care must be taken to avoid excessive decrease of confinement factor (Γ). As a result it is shown that DBSCH design is possible, where the low beam divergence and high COD level is achieved simultaneously. Wide stripe gain-guided LDs based on GaAsP/AlGaAs DBSCH SQW structures have been manufactured according to the design above. Gaussian-shaped narrow directional characteristics are in relatively good agreement with modelling predictions. Vertical beam divergences are 1315o and 1718o FWHM for design versions experimentally investigated. Threshold current densities of the order of 350270 Acm-2 and slope efficiencies of 0.95 and 1.15 W/A have been recorded for these two versions, respectively. Optical power at the level of 1 W has been achieved. The version with lower beam divergence proves to be more durable. Higher optical power levels are to be obtained after heterostructure doping optimisation.
In this work we discuss 3D selfconsistent solution of Poisson and Schrödinger equations for electrostatically formed quantum dot. 3D simulations give detailed insight into the energy spectrum of the device and allow us to find values of respective voltages ensuring given number of electrons in the dot. We performed calculations for fully 3D potential and apart from that calculations for the same potential separated into two independent parts, i.e. regarding to the plane of 2DEG and to the direction perpendicular to the meant plane. We found that calculations done for the two independent parts of the potential give good information about quantum dot properties and they are much faster compared to fully 3D simulations.
The paper presents the method and results of low-frequency noise measurements of modern mid-wavelength infrared photodetectors. A type-II InAs/GaSb superlattice based detector with nBn barrier architecture is compared with a high operating temperature (HOT) heterojunction HgCdTe detector. All experiments were made in the range 1 Hz - 10 kHz at various temperatures by using a transimpedance detection system, which is examined in detail. The power spectral density of the nBn’s dark current noise includes Lorentzians with different time constants while the HgCdTe photodiode has more uniform 1/f - shaped spectra. For small bias, the low-frequency noise power spectra of both devices were found to scale linearly with bias voltage squared and were connected with the fluctuations of the leakage resistance. Leakage resistance noise defines the lower noise limit of a photodetector. Other dark current components give raise to the increase of low-frequency noise above this limit. For the same voltage biasing devices, the absolute noise power densities at 1 Hz in nBn are 1 to 2 orders of magnitude lower than in a MCT HgCdTe detector. In spite of this, low-frequency performance of the HgCdTe detector at ~ 230K is still better than that of InAs/GaSb superlattice nBn detector.