Many precision devices, especially measuring devices, must maintain their technical parameters in variable ambient conditions, particularly at varying temperatures. Examples of such devices may be super precise balances that must keep stability and accuracy of the readings in varying ambient temperatures. Due to that fact, there is a problem of measuring the impact of temperature changes, mainly on geometrical dimensions of fundamental constructional elements of these devices. In the paper a new system for measuring micro-displacements of chosen points of a constructional element of balance with a resolution of single nanometres and accuracy at a level of fractions of micrometres has been proposed.
In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.
This paper describes the study of thermal properties of packages of silicon carbide Schottky diodes. In the paper the packaging process of Schottky diodes, the measuring method of thermal parameters, as well as the results of measurements are presented. The measured waveforms of transient thermal impedance of the examined diodes are compared with the waveforms of this parameter measured for commercially available Schottky diodes.