Stimulus with Limited Band Optimization for Analogue Circuit Testing

Journal title

Metrology and Measurement Systems




No 1



analogue circuit testing ; faults isolation ; evolutionary computations ; amplitude spectrum

Divisions of PAS

Nauki Techniczne




Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation




Artykuły / Articles


DOI: 10.2478/v10178-012-0006-y ; ISSN 0860-8229


Metrology and Measurement Systems; 2012; No 1; 73-84


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